New PDF release: Advanced Transmission Electron Microscopy: Imaging and

By Jian Min Zuo, John C.H. Spence

ISBN-10: 1493966057

ISBN-13: 9781493966059

ISBN-10: 1493966073

ISBN-13: 9781493966073

This quantity expands and updates the assurance within the authors' renowned 1992 ebook, Electron Microdiffraction. because the name implies, the focal point of the ebook has replaced from electron microdiffraction and convergent beam electron diffraction to all sorts of complicated transmission electron microscopy. exact consciousness is given to electron diffraction and imaging, together with high-resolution TEM and STEM imaging, and the appliance of those the right way to crystals, their defects, and nanostructures. The authoritative textual content summarizes and develops lots of the helpful wisdom which has been received through the years from the learn of the a number of electron scattering challenge, the hot improvement of aberration correctors and their purposes to fabrics constitution characterization, in addition to the authors' broad instructing adventure in those components. Advanced Transmission Electron Microscopy: Imaging and Diffraction in Nanoscience is perfect to be used as a sophisticated undergraduate or graduate point textual content in help in fact fabrics in fabrics technological know-how, Physics or Chemistry departments.

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Extra info for Advanced Transmission Electron Microscopy: Imaging and Diffraction in Nanoscience

Sample text

The complex number of Eq. 19) can be plotted in the so-called complex plane, with the x-axis for the real and the yaxis for the imaginary parts of the number (see Fig. 3). The length of the vector is the amplitude A, and its angle with the x-axis is h. The vector rotates as time progresses with frequency x. In the case that we have two waves with the same x: u ¼ ½A1 expðih1 Þ þ A2 expðih2 ފ expðÀixtÞ ð2:20Þ The resultant wave is a linear sum in the way that these two are added together as the addition of two vectors.

They are mounted on linear translation stages that allow both x and y motion at high 12 1 Introduction and Historical Background precision. Apertures are used to limit the number of electrons as well their direction, which are allowed to enter the magnetic lens or pass onto the specimen. The apertures accessible to the TEM user are the condenser aperture, the objective aperture, and the selected area aperture after the objective lens. The microscope has a vacuum pumping/handling system installed to keep the electron gun, sample area, and detectors as separate vacuum spaces.

In particular, the combination of the large scattering cross sections and a small probe (down to subnanometer dimensions) makes TEM the essential characterization tool for nanoscience and nanotechnology, which gives the strongest signal from the smallest volume of matter of any analysis technique. The field of TEM has grown tremendously as considerable efforts are now underway in many countries aimed at nanostructured materials. This book presents theory of electron diffraction, optics, microscopy techniques, and their practice in relationship to materials structure characterization.

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Advanced Transmission Electron Microscopy: Imaging and Diffraction in Nanoscience by Jian Min Zuo, John C.H. Spence


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